Verity Instruments announces SP2100 Spectral Reflectometer
It measures film thickness for in-situ and in-line applications using a high-performance spectrometer and Xenon flashlamp. Supports up to eight points.
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Optical endpoint detection systems provider
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It measures film thickness for in-situ and in-line applications using a high-performance spectrometer and Xenon flashlamp. Supports up to eight points.
It offers cost-effective general purpose use with minimal performance impact versus SD1024GL. Features 200-800 nm range, 48% smaller size, RoHS compliance.
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