Microsanj introduces a new platform for advanced characterization
The SanjSCOPE platform combines thermal imaging, materials characterization, and RF/EM field imaging into one configurable system.
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Semiconductor thermal, materials, and multiphysics characterization systems
microsanj.comLast updated
In short: Microsanj expanded into Europe, launched the SanjSCOPE platform, and developed advanced thermal metrology systems for 3D packaging.
The SanjSCOPE platform combines thermal imaging, materials characterization, and RF/EM field imaging into one configurable system.
High-speed IR microscopy separates direct RF heating from conductive diffusion, enhancing dosing accuracy and safety. Published in IEEE journal.
The expansion accelerates thermal metrology access across EU markets through local partnerships, training, and a dedicated web platform.
The system measures anisotropic thermal properties of thin films and bulk materials using POSH-TDTR technique. It supports materials like Si, SiC, and offers rapid, high-resolution results.
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